Get Composite View of Design and ATE Failure Waveforms! Mask or Fix ATE Failures Automatically!

BENEFITS

For Design:

• Visual inspection of ATE failures in VCD waveform viewer.
• Able to generate a new testbench reflecting ATE waveforms and/or with failures masked.

For Test:

• Having access to exact design timing for ATE pattern debug.
• No more tedious screen capturing of failure waveforms: Send a VCD representation of the ATE failures instead.

FEATURES

• Reads VCD, EVCD, WGL, STIL.
• Reads tester’s ASCII failure log (datalog) and user-specified timing dalays on a per-pin basis
• For each failing pin, generates new VCD with expected and actual waveforms.
• For each failing pin, applies Fix or Mask operation to each failing cycle.
• Generates a new testbench reflecting the actual waveforms.

Other TSSI Product Families

TVT^™ (TSSI Virtual Tester)

• TVT minimizes the time needed to debug and verify test program without needing to wait for the physical device and tester.
• TVT modeles all leading testers enabiling test program compilation and re-simulation “as is”, without further conversion back to testbench.

TDS^™ (Test Development Series)

• With the largest installed base, TDS is the enterprise strength tool suite since the 1980’s and has contributed to the industry the de facto standard Waveform Generation Language (WGL) in its heavily used WaveMaker module.
• TDS supports 30+ EDA formats and 90+ ATE models.

TestDeveloper Family (TD^™, TDSim^™, and TDScan^™)

• This Windows-based product suite is scalable, and most portable for pattern conversion teams to get their job done anywhere, anytime.
• TD products support VCD, EVCD, WGL, STIL and all leading ATE models from Advantest, Credence, LTX, Teradyne, and Verigy.