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John Blyler Interview on ChipEstimate.TV

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Sean O’Kane, Producer/Host ChipEstimate.TV interviews:

John Blyler, Editor-in-Chief, Chip Design
and Embedded Intel magazines

For more information about John Blyler go to:
http://www.facebook.com/john.blyler or https://twitter.com/#!/johnblyler or http://www.chipestimate.com/blogs/IPInsider/

For more information about ChipEstimate.TV go to: http://www.chipestimate.tv or ChipEstimate.com go to: http://www.chipestimate.com

 


blyler_john

John Blyler is the editorial director of Extension Media, which publishes Chip Design and Embedded Intel® Solutions magazine, plus over 36 EECatalog Engineers’ Guides in vertical market areas.

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    January - 2015

    November - 2014

    October - 2014

    July - 2014


    • Why Don't Software Programmers like Comments?

      Cristian Amitroaie, CEO of Amiq, talks with John Blyler about Specador, a automated HTML documentation tool for chip design and verification engineers. This tool generates meaningful documentation even from poorly documented source code, as it actually compiles the code and can generate cross-link class inheritance trees, design hierarchies, and diagrams. The need for this functionality lead to an interesting discussion about the software programming process and why programmers rarely document their own work.

    June - 2014

    April - 2014


    • Imec’s mm Wave Motion Sensing Technology

      Motion sensing applications with mm wave technology at Imec is the topic of this interview between Liesbet Van der Perre, Imec Program Director of Wireless Communication, and John Blyler, VP and CCO at Extension Media.

    December - 2013

    June - 2013


    • Collaboration is the key to chip innovation

      In our third interview at the Design Automation Conference in Austin, Texas, John Blyler of Chip Design Magazine talks with Dennis Bibeau of Infotech about the importance of collaboration across all disciplines in achieving innovative chip design.

    • Code integration facilitates chip innovation

      Chip Design's John Blyler interviews Cristian Amitroaie, CEO of AMIQ (http://www.amiq.ro) on the importance of code integration and the Eclipse platform At the Design Automation Conference in Austin, Texas.

    • Innovating with Statistical Analysis

      In our first interview at the Design Automation Conference in Austin, Texas, John Blyler talks with Zhihong Lu of Proplus (http://www.proplussolutions.com/en/contact/) about the problems and potential of innovation in chip design through statistical analysis.

    • RTL Signoff turns competitive

      In our fourth interview this week at the Design Automation Conference in Austin, Texas, EiC John Blyler of Chip Design talks with Mike Gianfagna, Vice President of Corporate Marketing at Atrenta, about the growing competition and advances in RTL Signoff.

    November - 2012

    September - 2012

    August - 2012

    July - 2012


    • Chipmakers Adopt Cymer’s SmartPulse™

      New Tech Press sat down with Nigel Farrar, vice president of marketing and lithography Technology for Cymer, Inc.(Nasdaq: CYMI) to talk about the prospects of extreme UV process adoption, as well as new products including the SmartPulse™ data management tool, and focus drilling technology for ArF immersion light sources.

    • KLA-Tencor 450mm-Capable Surfscan® SP3 Systems

      At Semicon West 2012 KLA-Tencor Corporation (NASDAQ: KLAC) talked with New Tech Press about new installations of the Surfscan® SP3 450, the first process control systems capable of handling and inspecting 450mm wafers. Marketing division head Amir Azordegan siad the system is a precursor for the industry wide acceptance of 450mm process development. He claimed the Surfscan SP3 450 delivers critical capability for manufacturers of 450mm process equipment, such as wet clean tools, CMP pads, slurries and polishers, film deposition tools and annealing systems. KLA-Tencor has received multiple orders for the tool and shipped six.