Efficient Noise Analysis for Complex Non-Periodic Analog/RF Blocks

This paper describes how AFS Transient Noise analysis enables circuit designers to efficiently perform SPICE-accurate device noise analysis on complex non-periodic analog/RF blocks. This capability enables designers to measure and optimize device noise analysis on complex blocks such as ADCs, frac-N PLLs, and int-N PLLs which would not otherwise have been possible without silicon iterations.

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