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    Static code analysis, runtime memory monitoring, unit testing, and flow analysis are all valuable techniques for finding bugs in embedded C-based software. On its own, each technique can help you find specific types of errors. Applying just one technique or applying the techniques in isolation, however, may allow bugs to slip through the cracks. The safest, most effective strategy is to apply all of these complementary techniques as part of a complete process. This establishes a bulletproof framework that helps you detect bugs that can evade specific techniques, while preventing future defects in your application. By applying a defect prevention strategy based on several quality activities, you create an environment for eliminating critical and difficult-to-detect functional problems.

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    Do you need some sort of circuit between your sensor and an analog-to-digital converter? Before you make any connections, get the electrical specifications for the analog-to-digital converter (ADC) and for the sensor or sensors in your system. The explanation in this white paper will help you understand what you need and why you need it.

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    How often should your equipment make measurements? This question often arises when people draft plans to automatically measure a physical quantity such as temperature, pressure, acidity, liquid level, and so on. You can approach this problem in several ways, from an educated guess to a mathematical analysis of your system. The examples in this white paper use temperature measurements because people measure temperature more than any other physical characteristic.

  • Differential Nonlinearity in Analog Measurements

    In most applications, linearity in analog measurements is more important than absolute precision. Ideally, in an A/D converter the digital value ramps smoothly as the input increases across its entire range. The deviation from ideal operation is a function of each ADC’s particular architecture and is expressed as differential nonlinearity (DNL). Find out how DNL is determined and the effect it has on making accurate measurements in this white paper.

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