LeCroy PCI Express® Protocol Test Card Adds Support for Single Root I/O Virtualization



Santa Clara, April 21, 2009—LeCroy Corporation, a leading supplier of oscilloscopes and serial data test solutions, today demonstrated new Single Root I/O Virtualization (SR-IOV) functionality on its PCI Express® Protocol Test Card (PTC). LeCroy demonstrated the new functionality in testing with SR-IOV add-in cards as part of Intel’s Virtual I/O Technology Showcase. SR-IOV is a PCI-SIG® workgroup extension to the PCI Express standard that makes it possible for a single PCI Express host bus adapter to behave simultaneously as several independent devices using a shared PCI Express physical link, and to allow multiple virtual machines to use the link more efficiently.

The Protocol Test Card has been enhanced to support testing for SR-IOV Virtualization, Address Translation Services and Alternative Routing ID Interpretation (ARI) Specification. ARI, a key SR-IOV feature, extends the number of simultaneously existing virtual functions to 256, and will significantly increase the capabilities of Root Complex and Switch devices in IOV implementations.

The LeCroy Protocol Test Card and Intel’s SR-IOV tests are employed in the Intel IHV Optimization Lab (IOL) to enhance interoperability between SR-IOV enabled devices. Vendors interested in testing their SR-IOV add-in cards at the Intel IOL should contact nathan.white@intel.com

SR-IOV technology is a key component in building a data center with efficient virtualized I/O,” said Jim Pappas, Director of Initiative Marketing for Intel Corporation. “The PCI Express Protocol Test Card from LeCroy will enable SR-IOV developers to insure a higher quality of interoperability and performance to their customers.”

“LeCroy is pleased to announce the SR-IOV enhancement to the LeCroy Protocol Test Card,” said John Wiedemeier, Product Marketing Manager, LeCroy. “The new SR-IOV capability enables the PTC, in combination with the advanced SR-IOV information display on the Summit™ T2-16 Protocol Analyzer, to allow users to quickly understand communication events in SR-IOV devices so that performance can be optimized.”

The new SR-IOV enhancements for the Protocol Test Card (in addition to the advanced SR-IOV information display on the Summit T2-16 Analyzer) are available for immediate shipment.

LeCroy protocol analyzers have been at the forefront of PCI Express development tools. All LeCroy protocol analyzers feature a hierarchical display, real-time statistics, protocol traffic summaries, detailed error reports, powerful scripting, and the ability to create user-defined test reports, which allow developers to troubleshoot intricate problems and finish their projects on time.

About LeCroy

LeCroy Corporation is a worldwide leader in serial data test solutions, creating advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals. The Company offers high-performance oscilloscopes, serial data analyzers, and global communications protocol test solutions used by design engineers in the computer and semiconductor, data storage device, automotive and industrial, and military and aerospace markets. LeCroy’s 40-year heritage of technical innovation is the foundation for its recognized leadership in “WaveShape Analysis”—capturing, viewing, and measuring the high-speed signals that drive today’s information and communications technologies. LeCroy is headquartered in Chestnut Ridge, New York. Company information is available at www.lecroy.com.

© 2009 by LeCroy Corporation. All rights reserved. Specifications are subject to change without notice.

Contact Information

Teledyne LeCroy

700 Chestnut Ridge Rd
Chestnut Ridge, NY, 10977
USA

toll-free: 800-553-2769
www.teledynelecroy.com

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